- 专利标题: EMBEDDED PATCH FOR LOCAL MATERIAL PROPERTY MODULATION
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申请号: US16522483申请日: 2019-07-25
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公开(公告)号: US20210028101A1公开(公告)日: 2021-01-28
- 发明人: Bai NIE , Haobo CHEN , Gang DUAN , Brandon C. MARIN , Srinivas PIETAMBARAM
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L23/66 ; H01L21/48
摘要:
Embodiments disclosed herein include electronic packages and methods of making such packages. In an embodiment, a package substrate comprises a substrate comprising a first dielectric material, a first trace embedded in the substrate, and a patch in direct contact with the first trace. In an embodiment, the patch comprises a second dielectric material that is different than the first dielectric material.
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