Invention Application
- Patent Title: SEMICONDUCTOR DEVICE PERFORMING LOOP-BACK TEST OPERATION
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Application No.: US17105137Application Date: 2020-11-25
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Publication No.: US20220165350A1Publication Date: 2022-05-26
- Inventor: Yoshihito Morishita , Hiroshi Ichikawa
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID BOISE
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID BOISE
- Main IPC: G11C29/52
- IPC: G11C29/52 ; G11C11/4093 ; G11C11/4096

Abstract:
Disclosed herein is an apparatus that includes a memory cell array; a data input/output terminal; a read data path and a write data path coupled in parallel between the memory cell array and the data input/output terminal, wherein the read data path includes a pre-driver and an output driver coupled in series, and wherein the write data path includes an input receiver and a latch circuit coupled in series; and a test path configured to provide a shortcut between the pre-driver in the read data path and the latch circuit in the write data path.
Public/Granted literature
- US11348660B1 Semiconductor device performing loop-back test operation Public/Granted day:2022-05-31
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