SEMICONDUCTOR DEVICE PERFORMING LOOP-BACK TEST OPERATION

    公开(公告)号:US20220165350A1

    公开(公告)日:2022-05-26

    申请号:US17105137

    申请日:2020-11-25

    Abstract: Disclosed herein is an apparatus that includes a memory cell array; a data input/output terminal; a read data path and a write data path coupled in parallel between the memory cell array and the data input/output terminal, wherein the read data path includes a pre-driver and an output driver coupled in series, and wherein the write data path includes an input receiver and a latch circuit coupled in series; and a test path configured to provide a shortcut between the pre-driver in the read data path and the latch circuit in the write data path.

    SEMICONDUCTOR DEVICE PERFORMING LOOP-BACK TEST OPERATION

    公开(公告)号:US20220262451A1

    公开(公告)日:2022-08-18

    申请号:US17736585

    申请日:2022-05-04

    Abstract: Disclosed herein is an apparatus that includes a memory cell array; a data input/output terminal; a read data path and a write data path coupled in parallel between the memory cell array and the data input/output terminal, wherein the read data path includes a pre-driver and an output driver coupled in series, and wherein the write data path includes an input receiver and a latch circuit coupled in series; and a test path configured to provide a shortcut between the pre-driver in the read data path and the latch circuit in the write data path.

    Semiconductor device performing loop-back test operation

    公开(公告)号:US11348660B1

    公开(公告)日:2022-05-31

    申请号:US17105137

    申请日:2020-11-25

    Abstract: Disclosed herein is an apparatus that includes a memory cell array; a data input/output terminal; a read data path and a write data path coupled in parallel between the memory cell array and the data input/output terminal, wherein the read data path includes a pre-driver and an output driver coupled in series, and wherein the write data path includes an input receiver and a latch circuit coupled in series; and a test path configured to provide a shortcut between the pre-driver in the read data path and the latch circuit in the write data path.

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