Invention Publication
- Patent Title: ETCHING METHOD AND ETCHING DEVICE
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Application No.: US17997155Application Date: 2021-04-15
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Publication No.: US20230223270A1Publication Date: 2023-07-13
- Inventor: Takehiko ORII , Nobuhiro TAKAHASHI
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Priority: JP 20079680 2020.04.28
- International Application: PCT/JP2021/015629 2021.04.15
- Date entered country: 2022-10-26
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/67 ; H01L21/02

Abstract:
An etching method of supplying etching gases to a substrate to etch a surface of the substrate, includes a protection step of supplying amine gas to the substrate having an oxygen-containing silicon film to form a protective film for preventing etching by the etching gases on a surface of the oxygen-containing silicon film, for protecting the oxygen-containing silicon film, and a first etching step of supplying a first etching gas, which is one of the etching gases and is a fluorine-containing gas, and the amine gas to the substrate to etch the oxygen-containing silicon film.
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