- 专利标题: PACKAGE STRUCTURES WITH COLLAPSE CONTROL FEATURES
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申请号: US17710502申请日: 2022-03-31
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公开(公告)号: US20230317630A1公开(公告)日: 2023-10-05
- 发明人: Wenhao Li , Feras Eid , Michael Baker , Pilin Liu , Zhaozhi Li
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01L23/00
- IPC分类号: H01L23/00
摘要:
Microelectronic die package structures formed according to some embodiments may include a substrate comprising one or more conductive interconnect structures on a surface of the substrate. One or more support features are on one or more peripheral regions of the surface of the substrate. A first side of a die is coupled to the one or more conductive interconnect structures and is over the one or more support features. A die backside layer is on the second side of the die.
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