Invention Publication
- Patent Title: Method for Analyzing Samples Including a High M/Z Cutoff
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Application No.: US18282841Application Date: 2021-11-18
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Publication No.: US20240177987A1Publication Date: 2024-05-30
- Inventor: Leigh BEDFORD , Thomas R. COVEY , James HAGER , Bradley B. SCHNEIDER
- Applicant: DH Technologies Development Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- International Application: PCT/IB2021/060678 2021.11.18
- Date entered country: 2023-09-19
- Main IPC: H01J49/42
- IPC: H01J49/42 ; G01N33/02 ; G01N33/483 ; H01J49/24

Abstract:
In one aspect, a method of performing mass spectrometric analysis of a sample, e.g. a food-based sample, is disclosed, which comprises ionizing the sample to generate a plurality of ions, introducing the plurality of ions into a mass filter configured to provide a high m/z cutoff greater than a maximum m/z ratio of ions associated with one or more analytes of interest in the sample so as to allow passage of the analyte ions while inhibiting passage of ions having m/z ratios above said high m/z cutoff, and performing a mass analysis of ions passing through said mass filter. In a related aspect, a mass spectrometer is disclosed, which comprises an atmospheric pressure ion source, a first mass filter, a user interface and a controller.
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