Planar Ion Processing Station
    2.
    发明公开

    公开(公告)号:US20240203719A1

    公开(公告)日:2024-06-20

    申请号:US18285715

    申请日:2022-04-04

    CPC classification number: H01J49/066 H01J49/061

    Abstract: In one aspect, an ion guide for use in a mass spectrometer is disclosed, which comprises a pair of printed circuit boards (PCBs) having an inlet for receiving a plurality of ions from an upstream ion source and outlet through which the ions exit the ion guide. The ion guide includes at least two ion paths provided in the space between the two PCBs for transmission of ions from the inlet to the outlet. The ion guide can further include at least one ion-routing device that can be coupled to the ions paths for selecting a propagation path of the ions between those ion paths. In some embodiments, the two ion paths can have at least one segment in common.

    System and Method for Variable FFT Analysis Windows in Mass Spectrometry

    公开(公告)号:US20240162027A1

    公开(公告)日:2024-05-16

    申请号:US18281722

    申请日:2022-03-17

    Inventor: James HAGER

    CPC classification number: H01J49/42 H01J49/063

    Abstract: In one aspect, a mass spectrometer is disclosed, which comprises an ion source for receiving a sample and ionizing at least a portion of the sample to generate a plurality of ions, and a Fourier Transform (FT) mass analyzer that is configured to receive at least a portion of said plurality of ions at an inlet thereof. The ions exiting the FT are detected by an ion detector, which generates a transient oscillating ion detection signal. The analyzer processes the ion detection signal via application of an FT thereto, where the FT window width is selected to optimize a mass signal associated with at least one target ion of interest.

    Bent PCB Ion Guide for Reduction of Contamination and Noise

    公开(公告)号:US20240290600A1

    公开(公告)日:2024-08-29

    申请号:US18278544

    申请日:2022-02-23

    CPC classification number: H01J49/062

    Abstract: In one aspect, an ion guide for use in a mass spectrometer is disclosed, which comprises a first plurality of conductive electrodes disposed on a first surface, a second plurality of conductive electrodes disposed on a second surface, wherein the two surfaces are positioned relative to one another and shaped so as to provide a passageway having an inlet for receiving an ion beam and an outlet through which target ions of interest exit the passageway. The ion guide further includes an orifice formed in at least one of those surfaces through which neutral species and/or large ion clusters, when present in the ion beam, exit the ion guide.

    High Pressure Mass Analyzer
    6.
    发明申请

    公开(公告)号:US20230027201A1

    公开(公告)日:2023-01-26

    申请号:US17792656

    申请日:2021-01-14

    Inventor: James HAGER

    Abstract: In one aspect, a mass spectrometer is disclosed, which comprises a Fourier Transform (FT) mass analyzer having an input port for receiving ions and an exit port through which the ions exit the FT mass analyzer, a detector disposed downstream of said FT analyzer for detecting ions exiting the FT analyzer, and a multi-segment ion guide having a plurality of segments, said multi-segment ion guide being disposed upstream of said FT mass analyzer and having an input port for receiving ions and an output port through which ions exit the FT mass analyzer. The segments of the ion guide are configured to be independently activated via application of a DC offset voltage thereto so as to adjust a length through which ions passing through the ion guide experience collisional cooling.

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