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US4424527A Bonding pad metallization for semiconductor devices 失效
用于半导体器件的接合焊盘金属化

Bonding pad metallization for semiconductor devices
Abstract:
The invention is directed to a bonding pad metallization for stress sensitive semiconductor devices such as semiconductor lasers or the like. An attendant advantage is a diffusion barrier layer which inhibits the migration of conventional bonding materials such as indium solder.
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