发明授权
US5398047A Semiconductor integrated circuit device including high-speed operating
circuit and low-speed operating circuit, and system using the same
失效
半导体集成电路器件包括高速运算电路和低速运算电路，以及使用该系统的系统
- 专利标题： Semiconductor integrated circuit device including high-speed operating circuit and low-speed operating circuit, and system using the same
- 专利标题（中）： 半导体集成电路器件包括高速运算电路和低速运算电路，以及使用该系统的系统
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申请号： US112982申请日： 1993-08-30
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公开(公告)号： US5398047A公开(公告)日： 1995-03-14
- 发明人: Takashi Nara , Yasuhiro Kanzawa , Akira Uragami , Masaou Takahashi
- 申请人： Takashi Nara , Yasuhiro Kanzawa , Akira Uragami , Masaou Takahashi
- 申请人地址： JPX Tokyo JPX Tokyo
- 专利权人： Hitachi, Ltd.,Hitachi Microcomputer Engineering Ltd.
- 当前专利权人： Hitachi, Ltd.,Hitachi Microcomputer Engineering Ltd.
- 当前专利权人地址： JPX Tokyo JPX Tokyo
- 优先权： JPX63-115183 19880511
- 主分类号： H01L21/822
- IPC分类号： H01L21/822 ; G09G5/06 ; G09G5/36 ; G09G5/39 ; G11C5/14 ; G11C7/00 ; G11C7/06 ; G11C8/10 ; G11C8/16 ; G11C11/401 ; H01L21/82 ; H01L21/8242 ; H01L27/04 ; H01L27/10 ; H01L27/108 ; H01L27/118 ; G09G5/18
摘要：
The semiconductor integrated circuit device formed on one semiconductor substrate employs a plurality of first and second circuit blocks constituting functions of the same kind. The first and second circuit blocks, however, are implemented with respectively different types of circuits. The type of circuit employed in the respective first and second circuit blocks is necessarily consistent with the particular operation speed requirements thereof, such as, in connection with high-speed and low-speed circuit requirements for writing into the memory of a display system.
公开/授权文献
- US4328552A Statistical calibration system 公开/授权日：1982-05-04
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