发明授权
US5436464A Foreign particle inspecting method and apparatus with correction for
pellicle transmittance
失效
外来粒子检测方法和具有防护薄膜透射率校正的装置
- 专利标题: Foreign particle inspecting method and apparatus with correction for pellicle transmittance
- 专利标题(中): 外来粒子检测方法和具有防护薄膜透射率校正的装置
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申请号: US044197申请日: 1993-04-08
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公开(公告)号: US5436464A公开(公告)日: 1995-07-25
- 发明人: Fuminori Hayano , Hideyuki Tashiro , Tsuneyuki Hagiwara , Hajime Moriya
- 申请人: Fuminori Hayano , Hideyuki Tashiro , Tsuneyuki Hagiwara , Hajime Moriya
- 申请人地址: JPX Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX4-118455 19920413; JPX4-173782 19920608; JPX4-161247 19920619
- 主分类号: G01N21/94
- IPC分类号: G01N21/94 ; G01N21/88
摘要:
In a foreign particle inspecting method and apparatus in which a polarized beam is applied to a surface to be inspected through a light transmitting member mounted thereon, in which scattered light from a foreign particle on the surface to be inspected is received by a light receiving device through the light transmitting member, and in which the foreign particle is discriminated based on a detection signal from the light receiving device, the detection signal is corrected in conformity with the transmittance of the light transmitting member for polarized incident scanning light and the transmittance of the light transmitting member for non-polarized light scattered from the foreign particle, for various angles of incidence of the polarized light and emergence of the non-polarized light. Foreign particle data may be indicated by a mapping method.
公开/授权文献
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