A circuit arrangement 10 for driving an MOS field-effect transistor QO allocated to the supply circuit KO of an electrical load R.sub.L contains a charging circuit K1 and a discharging circuit K2, which can be alternatively connected to the MOS field-effect transistor QO. A sensing circuit K3 supplies the measuring signal S.sub.M typical of gate-source voltage U.sub.GS of the MOS field-effect transistor QO, via which the internal resistance of the charging or discharging circuit K1, K2 and/or a current I.sub.a impressed upon these circuits K1, K2, in the sense of a positive feedback, is controlled, in such a way that the resulting time constant, according to which the input capacitance of the MOS field-effect, transistor QO is charged or discharged, becomes smaller during the transition of the MOS field-effect transistor QO from the off state to the conductive state and larger during the transition from the conductive to the off-state.