Invention Grant
- Patent Title: Method for doping epitaxial layers using doped substrate material
- Patent Title (中): 使用掺杂衬底材料掺杂外延层的方法
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Application No.: US754949Application Date: 1996-11-21
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Publication No.: US5861321APublication Date: 1999-01-19
- Inventor: John H. Tregilgas , Donald F. Weirauch , John A. Dodge , Sidney G. Parker
- Applicant: John H. Tregilgas , Donald F. Weirauch , John A. Dodge , Sidney G. Parker
- Applicant Address: TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: TX Dallas
- Main IPC: C30B25/02
- IPC: C30B25/02 ; C30B25/18 ; H01L21/368 ; H01L21/208
Abstract:
A method is provided for producing an n-type or p-type epitaxial layer using a doped substrate material. The method includes growing a substrate (12), preferably from a material to which an epitaxial layer can be lattice-matched. The substrate (12) is doped with a predetermined concentration of dopant (14). Preferably, the dopant (14) possesses the ability to rapidly diffuse through a material. An epitaxial layer (16) is grown upon the doped substrate (12). The epitaxial layer (16) and the doped substrate are annealed, thereby causing the dopant (14) to diffuse from the substrate (14) into the epitaxial layer (16).
Public/Granted literature
- US5179411A Inversion development controller Public/Granted day:1993-01-12
Information query
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