发明授权
- 专利标题: Field emission displays with reduced light leakage
- 专利标题(中): 具有减少漏光的场发射显示
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申请号: US256882申请日: 1999-02-24
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公开(公告)号: US6133056A公开(公告)日: 2000-10-17
- 发明人: David A. Cathey, Jr. , John K. Lee , Tianhong Zhang , Behnam Moradi
- 申请人: David A. Cathey, Jr. , John K. Lee , Tianhong Zhang , Behnam Moradi
- 申请人地址: ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: ID Boise
- 主分类号: H01J1/05
- IPC分类号: H01J1/05 ; H01J9/02 ; H01L21/00 ; H01L21/4763 ; H01L29/06
摘要:
Semiconductor devices may be made by forming a silicided layer on a silicon material such as that used to form the extractor of a field emission display. The silicided layer may be self-aligned with the emitter of a field emission display. If the silicided layer is treated at a temperature above 1000.degree. C. by exposure to a nitrogen source, the silicide is resistant to subsequent chemical attack such as that involved in a buffered oxide etching process.
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