发明授权
- 专利标题: Fault emulation testing of programmable logic devices
- 专利标题(中): 可编程逻辑器件的故障仿真测试
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申请号: US09853351申请日: 2001-05-11
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公开(公告)号: US06594610B1公开(公告)日: 2003-07-15
- 发明人: Shahin Toutounchi , Anthony P. Calderone , Zhi-Min Ling , Robert D. Patrie , Eric J. Thorne , Robert W. Wells
- 申请人: Shahin Toutounchi , Anthony P. Calderone , Zhi-Min Ling , Robert D. Patrie , Eric J. Thorne , Robert W. Wells
- 主分类号: G06F1900
- IPC分类号: G06F1900
摘要:
A new testing method uses a field programmable gate array to emulate faults, instead of using a separate computer to simulate faults. In one embodiment, a few (e.g., two or three) known good FPGAs are selected. A fault is introduced into the design of a FPGA configuration. The configuration is loaded into the FPGAs. A test vector is applied and the result is evaluated. If the result is different from that of a fault-free configuration, the fault is caught. One application of this method is to evaluate fault coverage. A fault model that can be used in the present invention is disclosed.
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