发明授权
- 专利标题: Floating gate and fabricating method thereof
- 专利标题(中): 浮栅及其制造方法
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申请号: US10395991申请日: 2003-03-24
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公开(公告)号: US06872623B2公开(公告)日: 2005-03-29
- 发明人: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- 申请人: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- 申请人地址: TW Taoyuan
- 专利权人: Nanya Technology Corporation
- 当前专利权人: Nanya Technology Corporation
- 当前专利权人地址: TW Taoyuan
- 代理机构: Ladas & Parry LLP
- 优先权: TW91116930A 20020729
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L29/423 ; H01L21/336
摘要:
A floating gate and fabrication method thereof. A semiconductor substrate is provided, on which an oxide layer, a first conducting layer, and a patterned hard mask layer having an opening are sequentially formed. A spacer is formed on the sidewall of the opening. A second conducting layer is formed on the hard mask layer. The second conducting layer is planarized to expose the surface of the patterned hard mask layer. The surface of the second conducting layer is oxidized to form an oxide layer. The patterned hard mask layer and the oxide layer and the first conducting layer underlying the patterned hard mask layer are removed.
公开/授权文献
- US20040016954A1 Floating gate and fabricating method thereof 公开/授权日:2004-01-29
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