发明授权
- 专利标题: Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment
- 专利标题(中): 使用莫尔设备测量物体的三维形状的方法和装置
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申请号: US10181679申请日: 2001-10-31
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公开(公告)号: US06873421B2公开(公告)日: 2005-03-29
- 发明人: Ssang-Gun Lim , Seung-Woo Kim , Sang-Yoon Lee , Chang-Jin Chung , Yi-Bae Choi , Young-Sik Cho , Kyung-Keun Park
- 申请人: Ssang-Gun Lim , Seung-Woo Kim , Sang-Yoon Lee , Chang-Jin Chung , Yi-Bae Choi , Young-Sik Cho , Kyung-Keun Park
- 申请人地址: KR
- 专利权人: Intek Plus Co., Ltd.
- 当前专利权人: Intek Plus Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Cantor Colburn LLP
- 优先权: KR2000-69549 20001122
- 国际申请: PCTKR01/01841 WO 20011031
- 国际公布: WO0243402 WO 20020530
- 主分类号: H04N13/00
- IPC分类号: H04N13/00 ; G01B11/25 ; G01B11/24
摘要:
An apparatus and method for measuring a three-dimensional shape of an object using a projection moiré device. The method comprises the steps of obtaining a grid pattern image projected on a reference plane of a moving table and applying a buckets algorithm thereto, thereby achieving a reference phase, obtaining a grid pattern image projected on the object set on the moving table and applying a buckets algorithm thereto, thereby achieving an object phase, calculating a difference phase between the object phase and the reference phase, thereby achieving a moiré phase, and unwrapping the moiré phase, thereby achieving a level information of the object. The apparatus and method measure the three-dimensional shape using a projection grid without a reference grid, thereby achieving compactness of equipment, simplicity in usage and manufacturing cost reduction.
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