发明授权
- 专利标题： Semiconductor integrated circuit allowing proper detection of pin contact failure
- 专利标题（中）： 半导体集成电路允许正确检测引脚接触故障
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申请号： US10136398申请日： 2002-05-02
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公开(公告)号： US06900628B2公开(公告)日： 2005-05-31
- 发明人: Hidenori Shirahama , Masaaki Mihara
- 申请人： Hidenori Shirahama , Masaaki Mihara
- 申请人地址： JP Tokyo
- 专利权人： Renesas Technology Corp.
- 当前专利权人： Renesas Technology Corp.
- 当前专利权人地址： JP Tokyo
- 代理机构： McDermott Will & Emery LLP
- 优先权： JP2001-257493 20010828
- 主分类号： H01L21/66
- IPC分类号： H01L21/66 ; G01R31/28 ; H03K19/00 ; G01R31/02
摘要：
In a pin contact test, a voltage across an external pin is measured by setting a voltage to be supplied to the power supply nodes in input protection circuits in their respective chips at a prescribed amount by means of voltage control circuits and by supplying a prescribed constant current to external pin. Based on the measurement results, a pin contact failure in chips can be detected.
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