发明授权
- 专利标题: Test apparatus for testing substrates at low temperatures
- 专利标题(中): 用于在低温下测试基板的测试装置
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申请号: US10677178申请日: 2003-10-02
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公开(公告)号: US07046025B2公开(公告)日: 2006-05-16
- 发明人: Stefan Schneidewind , Claus Dietrich , Jorg Kiesewetter , Frank-Michael Werner , Axel Schmidt , Matthias Zieger
- 申请人: Stefan Schneidewind , Claus Dietrich , Jorg Kiesewetter , Frank-Michael Werner , Axel Schmidt , Matthias Zieger
- 申请人地址: DE Saca bei Dresden
- 专利权人: SUSS MicroTec Testsystems GmbH
- 当前专利权人: SUSS MicroTec Testsystems GmbH
- 当前专利权人地址: DE Saca bei Dresden
- 代理机构: Baker Botts LLP
- 优先权: DE10246232 20021002; DE10246282 20021002
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A test apparatuss for testing substrates at low temperatures has a chuck, which can be displaced in the working area by means of a chuck drive, the temperature of which can be controlled using heating and cooling means. The chuck has a receiving surface for receiving a test substrate and holding means for fixing a substrate carrier which receives the test substrate. Spatially and thermally defined test conditions are maintained with minimal energy and labor costs both at room temperatures and at low temperatures. This is achieved by providing a vacuum chamber which surrounds the working area of the chuck. The chuck is on one side thermally decoupled from the uncooled chuck drive and on the other side is thermally connected in a releasable manner to the test substrate. The cooled chuck and the cooled test substrate are shielded from the thermal radiation of the surrounding uncooled assemblies by means of a directly cooled thermal radiation shield.
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