Invention Grant
- Patent Title: Method in inspecting DNA and apparatus therefor
- Patent Title (中): 检查DNA及其仪器的方法
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Application No.: US10229204Application Date: 2002-08-26
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Publication No.: US07309568B2Publication Date: 2007-12-18
- Inventor: Yoshitada Oshida , Satoshi Takahashi , Kenji Yasuda , Taisaku Seino
- Applicant: Yoshitada Oshida , Satoshi Takahashi , Kenji Yasuda , Taisaku Seino
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Townsend and Townsend and Crew LLP
- Priority: JP2001-292783 20010926; JP2002-034805 20020213
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12M1/00 ; B32B5/02 ; G01N21/00
Abstract:
A method and apparatus of stably obtaining fluorescent images of two or more fluorescent samples includes disposing the samples onto compartments defined on a substrate. The compartments are sequentially irradiated with an exciting light where the intensity varies. A value of fluorescence as generated from each of the samples is determined, and a fluorescent image is obtained based on the value of fluorescence.
Public/Granted literature
- US20030087282A1 Method in inspecting DNA and apparatus therefor Public/Granted day:2003-05-08
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