Invention Grant
- Patent Title: Method for marking defect and device therefor
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Application No.: US12228478Application Date: 2008-08-13
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Publication No.: US07599052B2Publication Date: 2009-10-06
- Inventor: Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
- Applicant: Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
- Applicant Address: JP Tokyo
- Assignee: NKK Corporation
- Current Assignee: NKK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Frishauf, Holtz, Goodman & Chick, P.C.
- Priority: JP11-072962 19990318; JP11-179776 19990625; JP11-187961 19990701; JP11-283703 19991005; JP2000-017739 20000121
- Main IPC: G01N21/00
- IPC: G01N21/00 ; A47L1/08
Abstract:
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
Public/Granted literature
- US20090086209A1 Method for marking defect and device therefor Public/Granted day:2009-04-02
Information query
