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公开(公告)号：US07599052B2
公开(公告)日：2009-10-06
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
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公开(公告)号：US07248366B2
公开(公告)日：2007-07-24
申请号：US09956737
申请日：2001-09-17
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
摘要翻译： 缺陷标记方法包括以下步骤：在钢板的连续加工线中安装表面缺陷测试仪以检测表面缺陷和标记装置在缺陷位置施加标记; 使用表面缺陷测试仪检测钢板表面缺陷; 根据这样检测到的缺陷信息确定钢板宽度方向的缺陷名，缺陷等级，缺陷长度和缺陷位置，进一步确定有害缺陷，注意缺陷和无害缺陷方面的缺陷; 对每个有害缺陷和不合理缺陷的缺陷位置进行跟踪; 并将标记应用于缺陷位置。 缺陷标记装置包括具有多个光接收部分和信号处理部分的缺陷检查装置和标记装置。
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公开(公告)号：US4440300A
公开(公告)日：1984-04-03
申请号：US368133
申请日：1982-04-14
申请人： Tatsuo Kanazawa , Tsuneo Suyama
发明人： Tatsuo Kanazawa , Tsuneo Suyama
CPC分类号： B65D85/62 , B65D85/20 , Y10S206/821
摘要： A device for holding pipes of different diameters in a nested state comprising a plurality of engaging members each having at an intermediate portion thereof an abutting portion adapted to contact the socket end of each diametrically small pipe for restraining the small pipe from moving axially thereof, each of the engaging members being provided at least at its one end with an engaging portion fittingly engageable in an annular groove formed in the inner periphery of the socket of the diametrically largest pipe; and one or more connecting means for removably connecting the engaging members together. The holding device comprises light-weight components, is simple in construction and can be attached to nested pipes easily for holding the pipes reliably at all times.
摘要翻译： 一种用于在嵌套状态下保持不同直径的管的装置，包括多个接合构件，每个接合构件的中间部分具有适于接触每个径向小管的插座端的抵接部分，用于限制小管轴向移动， 所述接合构件的至少一端具有与所述直径最大的管的所述插座的内周形成的环形槽嵌合的接合部; 以及用于将接合构件可拆卸地连接在一起的一个或多个连接装置。 保持装置包括重量轻的部件，结构简单，可以方便地连接到嵌套管道上，以始终保持管道可靠。
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公开(公告)号：US20090086209A1
公开(公告)日：2009-04-02
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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公开(公告)号：US4434892A
公开(公告)日：1984-03-06
申请号：US392212
申请日：1982-06-25
申请人： Tatsuo Kanazawa , Tsuneo Suyama
发明人： Tatsuo Kanazawa , Tsuneo Suyama
CPC分类号： B65D59/00 , B65D85/20 , Y10S206/821
摘要： A device for holding nested pipes which comprises an abutting member adapted to bear against the socket ends of all the pipes, and radial-axial retainer means removably mountable on the abutting member and having an engaging projection fittingly engageable in an annular groove of the diametrically larger of two adjacent pipes included in the pipes and engaging stepped means engageable with an annular shoulder of the diametrically smaller of the two pipes. The device is composed of a small number of parts, is therefore inexpensive to make and easy to install on the pipes and reliably holds the pipes even when the two adjacent pipes differ greatly in diameter. Such devices are usable as units to provide a compact and lightweight overall holding device since a mount frame which would add to the weight of the device is not always needed.
摘要翻译： 一种用于保持嵌套管的装置，其包括适于承受所有管的插座端部的抵接构件以及可移除地安装在抵接构件上的径向轴向保持器装置，并且具有接合突出部，该接合突起可匹配地接合在直径较大的环形槽中 包括在管道中的两个相邻管道和接合阶梯装置可与两个管道中直径较小的环形肩部接合。 该装置由少量部件组成，因此即使当两个相邻管道的直径差异很大时，制造成本便宜并且容易安装在管道上并且可靠地保持管道。 这样的装置可用作提供紧凑且轻便的整体保持装置的单元，因为不一定需要增加装置的重量的安装框架。
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公开(公告)号：US07423744B2
公开(公告)日：2008-09-09
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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公开(公告)号：US20070052964A1
公开(公告)日：2007-03-08
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/84
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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