Invention Grant
- Patent Title: Corrector for charged-particle beam aberration and charged-particle beam apparatus
-
Application No.: US12183622Application Date: 2008-07-31
-
Publication No.: US07737413B2Publication Date: 2010-06-15
- Inventor: Hiroyuki Ito , Yuko Sasaki , Yoshiya Higuchi , Takeshi Kawasaki
- Applicant: Hiroyuki Ito , Yuko Sasaki , Yoshiya Higuchi , Takeshi Kawasaki
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2007-198275 20070731
- Main IPC: G21K1/08
- IPC: G21K1/08 ; H01J3/14 ; H01J3/26 ; H01J49/42

Abstract:
In a charged-particle beam apparatus having a high-accuracy and high-resolution focusing optical system for charged-particle beam, a group of coils are arranged along a beam emission axis to extend through the contour of radial planes each radiating from the beam emission axis representing a rotary axis and each having a circular arc which subtends a divisional angle resulting from division of a circumferential plane by a natural number larger than 2 so that a superposed magnetic field may be generated on the incident axis of the charged-particle beam and the trajectory of the charged-particle beam may be controlled by the superposed magnetic field.
Public/Granted literature
- US07872240B2 Corrector for charged-particle beam aberration and charged-particle beam apparatus Public/Granted day:2011-01-18
Information query