发明授权
US08010916B2 Test yield estimate for semiconductor products created from a library
有权
从图书馆创建的半导体产品的测试产量估算
- 专利标题: Test yield estimate for semiconductor products created from a library
- 专利标题(中): 从图书馆创建的半导体产品的测试产量估算
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申请号: US12062586申请日: 2008-04-04
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公开(公告)号: US08010916B2公开(公告)日: 2011-08-30
- 发明人: Jeanne Bickford , Markus Buehler , Jason D. Hibbeler , Juergen Koehl
- 申请人: Jeanne Bickford , Markus Buehler , Jason D. Hibbeler , Juergen Koehl
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Gibb I.P. Law Firm, LLC
- 代理商 Richard M. Kotulak, Esq.
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Disclosed is a method that predicts test yield for a semiconductor product, prior to design layout. This is accomplished by applying a critical area analysis to individual library elements that are used to form a specific product and by estimating the test yield impact of combining these library elements. For example, the method considers the test yield impact of sensitivity to library element to library element shorts and the test yield impact of sensitivity to wiring faults. The disclosed method further allows die size growth to be traded off against the use of library elements with higher test yield in order to provide an optimal design solution. Thus, the method may be used to modify library element selection so as to optimize test yield. Lastly, the method further repeats itself at key design checkpoints to revalidate initial test yield (and cost) assumptions made when the product was quoted to a customer. Thus, the method provides increased accuracy of test yield estimate from initial sizing through design and further allows designs to be modified to improve test yield.