发明授权
- 专利标题: Method of manufacturing semiconductor device and semiconductor device manufactured thereof
- 专利标题(中): 制造半导体器件和半导体器件的方法
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申请号: US12105318申请日: 2008-04-18
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公开(公告)号: US08067776B2公开(公告)日: 2011-11-29
- 发明人: Shigeharu Yamagami , Masakatsu Hoshi , Tetsuya Hayashi , Hideaki Tanaka
- 申请人: Shigeharu Yamagami , Masakatsu Hoshi , Tetsuya Hayashi , Hideaki Tanaka
- 申请人地址: JP Yokohama-shi, Kanagawa
- 专利权人: Nissan Motor Co., Ltd.
- 当前专利权人: Nissan Motor Co., Ltd.
- 当前专利权人地址: JP Yokohama-shi, Kanagawa
- 代理机构: Young Basile
- 优先权: JP2007-153006 20070608; JP2007-333626 20071226
- 主分类号: H01L29/12
- IPC分类号: H01L29/12 ; H01L29/76 ; H01L29/78 ; H01L21/28 ; H01L21/336
摘要:
Methods of manufacturing a semiconductor device including a semiconductor substrate and a hetero semiconductor region including a semiconductor material having a band gap different from that of the semiconductor substrate and contacting a portion of a first surface of the semiconductor substrate are taught herein, as are the resulting devices. The method comprises depositing a first insulating film on exposed portions of the first surface of the semiconductor substrate and on exposed surfaces of the hetero semiconductor material and forming a second insulating film between the first insulating film and facing surfaces of the semiconductor substrate and the hetero semiconductor region by performing a thermal treatment in an oxidizing atmosphere.
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