Invention Grant
- Patent Title: Test fixture with high-current electrical connection
- Patent Title (中): 测试夹具具有大电流电气连接
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Application No.: US12275708Application Date: 2008-11-21
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Publication No.: US08302948B2Publication Date: 2012-11-06
- Inventor: Michael A. Hobson , David A. Milani
- Applicant: Michael A. Hobson , David A. Milani
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Main IPC: B25B1/20
- IPC: B25B1/20 ; B25B5/00 ; B25B1/10 ; B25B5/10 ; B23Q3/08 ; G01R31/00 ; A61B18/18 ; H01R4/28

Abstract:
A test fixture for making an electrical connection with electrical contacts of a circuit board includes jaws made of conductive material. The jaws may be monolithic pieces of copper, with a pair of sections that pivot along a thin hinged portion at one end. The jaws float freely within a test fixture housing, allowing the jaws to reposition themselves within the housing to adjust to variations in position of the electrical contacts. A clamping mechanism pushes free ends of the jaw sections toward one another, causing engagement between the sections and the electrical contacts. The test fixture provides a way to provide good contact area and good contact pressure, allowing large-current flows between the jaws and the electrical contacts, while at the same time providing substantially no force on the circuit board in a direction perpendicular to the circuit board.
Public/Granted literature
- US20100130073A1 TEST FIXTURE WITH HIGH-CURRENT ELECTRICAL CONNECTION Public/Granted day:2010-05-27
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