利索-全球专利检索

  1. 登录
  2. 注册
发明授权
US08482308B2 Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same 有权
连接单元以测试半导体芯片和设备以测试具有相同的半导体芯片

Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same
摘要：
A connecting unit to test a semiconductor chip and an apparatus to test the semiconductor chip having the same include a plurality of connectors, on which a semiconductor chip having a certain pattern of electrical connection terminals, having a plurality of holes, cables configured to electrically connect the electrical connection terminals to the exterior, and coupling units configured to selectively electrically connect the cables to the electrical connection terminals through the holes. Therefore, it is possible to perform electrical tests of semiconductor chips having various patterns of electrical connection terminals and receive the semiconductor chips in a tray at a time.
摘要（中）：

用于测试半导体芯片的连接单元和用于测试具有该连接器的半导体芯片的装置包括多个连接器，其上具有一定形式的电连接端子的半导体芯片具有多个孔，电缆被配置为电连接 电连接端子到外部，以及耦合单元，其被配置成选择性地将电缆电连接到电连接端子上。 因此，可以对具有各种电连接端子的图案的半导体芯片进行电气测试，并且一次接收托盘中的半导体芯片。

公开/授权文献
信息查询
Espacenet
0/0