Invention Grant
- Patent Title: Clustered stacked vias for reliable electronic substrates
- Patent Title (中): 集成的通孔用于可靠的电子基板
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Application No.: US13549440Application Date: 2012-07-14
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Publication No.: US08522430B2Publication Date: 2013-09-03
- Inventor: Karan Kacker , Douglas O. Powell , David L. Questad , David J. Russell , Sri M. Sri-Jayantha
- Applicant: Karan Kacker , Douglas O. Powell , David L. Questad , David J. Russell , Sri M. Sri-Jayantha
- Applicant Address: US NY Armonk
- Assignee: International Business Macines Corporation
- Current Assignee: International Business Macines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Vazken Alexanian
- Agent Michael J. Buchenhorner
- Main IPC: H05K3/40
- IPC: H05K3/40 ; H01L21/768 ; H01L23/48

Abstract:
A method of fabricating a substrate via structure in a substrate/chip assembly includes steps of: disposing a center via stack for electrical interconnects in the substrate/chip assembly; and providing a plurality of stacked vias surrounding the center via stack. The plurality of stacked vias encircle the center via stack, resulting in no isolated via stacks on the structure. The plurality of stacked vias have both functional and non-functional vias.
Public/Granted literature
- US20120279061A1 CLUSTERED STACKED VIAS FOR RELIABLE ELECTRONIC SUBSTRATES Public/Granted day:2012-11-08
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