Invention Grant
- Patent Title: Via/contact and damascene structures
- Patent Title (中): 通过/接触和镶嵌结构
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Application No.: US13563495Application Date: 2012-07-31
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Publication No.: US08531036B2Publication Date: 2013-09-10
- Inventor: Shih-Chieh Chang , Ying-Lang Wang , Kei-Wei Chen , Jung-Chih Tsao , Yu-Sheng Wang
- Applicant: Shih-Chieh Chang , Ying-Lang Wang , Kei-Wei Chen , Jung-Chih Tsao , Yu-Sheng Wang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A semiconductor structure is provided and includes a dielectric layer disposed over a substrate. A first non-conductive barrier layer is formed over the dielectric layer. At least one opening is formed through the first non-conductive barrier layer and within the dielectric layer. A second non-conductive barrier layer is formed over the first non-conductive barrier layer and within the opening. At least a portion of the second non-conductive barrier layer is removed, thereby at least partially exposing a top surface of the first non-conductive barrier layer and a bottom surface of the opening, with the second non-conductive barrier layer remaining on sidewalls of the opening. A seed layer and conductive layer is disposed in the opening.
Public/Granted literature
- US20120292768A1 VIA/CONTACT AND DAMASCENE STRUCTURES Public/Granted day:2012-11-22
Information query
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