发明授权
US08546130B2 Oligomer probe array with improved signal-to-noise ratio fabrication method thereof
失效
具有改进的信噪比制造方法的低聚物探针阵列
- 专利标题: Oligomer probe array with improved signal-to-noise ratio fabrication method thereof
- 专利标题(中): 具有改进的信噪比制造方法的低聚物探针阵列
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申请号: US11686546申请日: 2007-03-15
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公开(公告)号: US08546130B2公开(公告)日: 2013-10-01
- 发明人: Jung-hwan Hah , Sung-min Chi , Kyoung-seon Kim , Won-sun Kim
- 申请人: Jung-hwan Hah , Sung-min Chi , Kyoung-seon Kim , Won-sun Kim
- 申请人地址: KR Suwon-Si, Gyeonggi-Do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si, Gyeonggi-Do
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2006-0039716 20060502
- 主分类号: C12Q1/00
- IPC分类号: C12Q1/00 ; C12Q1/68 ; G01N33/53 ; G01N33/553 ; G01N33/545 ; C12M1/34 ; C07H21/02
摘要:
An oligomer probe array with improved signal-to-noise ratio includes a substrate, a plurality of probe cell active regions formed on or in the substrate, with each of the plurality of probe cell active regions having a substantially planar surface and being coupled with at least one oligomer probe with own sequence, and a probe cell isolation region defining the probe cell active regions and having no functional groups for coupling with the oligomer probes on a surface.
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