Invention Grant
US08653474B2 Charged particle extraction device and method of design there for 有权
带电粒子提取装置及其设计方法

Charged particle extraction device and method of design there for
Abstract:
The present invention provides a method for extracting a charged particle beam from a charged particle source. A set of electrodes is provided at the output of the source. The potentials applied to the electrodes produce a low-emittance growth beam with substantially zero electric field at the output of the electrodes.
Public/Granted literature
Information query
Patent Agency Ranking
0/0