Invention Grant
- Patent Title: Device for analysis of a sample on a test element
- Patent Title (中): 用于分析测试元件上的样品的设备
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Application No.: US13670057Application Date: 2012-11-06
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Publication No.: US08692119B2Publication Date: 2014-04-08
- Inventor: Stefan Riebel , Manfred Augstein , Gregor Bainczyk , Albert Grosser , Oliver Kube , Dieter Meinecke , Bruno Thoes , Herbert Wieder
- Applicant: Roche Diagnostics Operations, Inc.
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Krieg DeVault LLP
- Priority: EP05023219 20051025
- Main IPC: H01B5/14
- IPC: H01B5/14
Abstract:
An analysis device for analysis of a sample on a test element is provided that comprises at least one component configured to make electrical contact with at least one other component for electrical transmission therebetween. The at least one component generally comprises an injection-molded circuit mount, also called an MID, or molded interconnect device.
Public/Granted literature
- US20130062202A1 DEVICE FOR ANALYSIS OF A SAMPLE ON A TEST ELEMENT Public/Granted day:2013-03-14
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