Invention Grant
- Patent Title: Adjusting reference resistances in determining MRAM resistance states
- Patent Title (中): 调整参考电阻确定MRAM电阻状态
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Application No.: US13443056Application Date: 2012-04-10
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Publication No.: US08902641B2Publication Date: 2014-12-02
- Inventor: Yue-Der Chih , Chin-Yi Huang , Chun-Jung Lin , Kai-Chun Lin , Hung-Chang Yu
- Applicant: Yue-Der Chih , Chin-Yi Huang , Chun-Jung Lin , Kai-Chun Lin , Hung-Chang Yu
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G11C11/16
- IPC: G11C11/16 ; G11C11/15

Abstract:
Magneto-resistive memory bit cells in an array have high or low resistance states storing logic values. During read operations, a bias source is coupled to an addressed memory word, coupling a parameter related to cell resistance to a sense amplifier at each bit position. The sense amplifiers determine whether the parameter value is greater or less than a reference value between the high and low resistance states. The reference value is derived by averaging or splitting a difference of resistances of reference cells at high and/or low resistance states. Bias current is conducted over address lines with varying resistance, due to different distances between the sense amplifiers and addressed memory words, which is canceled by inserting into the comparison circuit a resistance from a dummy addressing array, equal to the resistance of the conductor addressing the selected word line and bit position.
Public/Granted literature
- US20130265820A1 ADJUSTING REFERENCE RESISTANCES IN DETERMINING MRAM RESISTANCE STATES Public/Granted day:2013-10-10
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