Invention Grant
- Patent Title: Finfet formed over dielectric
- Patent Title (中): Finfet在电介质上形成
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Application No.: US14035313Application Date: 2013-09-24
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Publication No.: US09041094B2Publication Date: 2015-05-26
- Inventor: Hong He , Chiahsun Tseng , Chun-Chen Yeh , Yunpeng Yin
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L29/772
- IPC: H01L29/772 ; H01L29/06

Abstract:
A method for semiconductor fabrication includes patterning one or more mandrels over a semiconductor substrate, the one or more mandrels having dielectric material formed therebetween. A semiconductor layer is formed over exposed portions of the one or more mandrels. A thermal oxidation is performed to diffuse elements from the semiconductor layer into an upper portion of the one or more mandrels and concurrently oxidize a lower portion of the one or more mandrels to form the one or more mandrels on the dielectric material.
Public/Granted literature
- US20150054121A1 FINFET FORMED OVER DIELECTRIC Public/Granted day:2015-02-26
Information query
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