Invention Grant
- Patent Title: Error detection and correction apparatus and method
- Patent Title (中): 误差检测和校正装置及方法
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Application No.: US13727561Application Date: 2012-12-26
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Publication No.: US09043674B2Publication Date: 2015-05-26
- Inventor: Wei Wu , Shih-Lien L. Lu , Rajat Agarwal , Henry Stracovsky
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H03M13/00
- IPC: H03M13/00 ; H03M13/15 ; H03M13/03 ; H03M13/11 ; H03M13/37

Abstract:
Embodiments of apparatus and methods for error detection and correction are described. A codeword may have a data portion and associated check bits. In embodiments, one or more error detection modules may be configured to detect a plurality of error types in the codeword. One or more error correction modules coupled with the one or more error detection modules may be further configured to correct errors of the plurality of error types once they are detected by the one or more error detection modules. Other embodiments may be described and/or claimed.
Public/Granted literature
- US20140181618A1 ERROR DETECTION AND CORRECTION APPARATUS AND METHOD Public/Granted day:2014-06-26
Information query
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