Invention Grant
- Patent Title: Mass spectrometer
- Patent Title (中): 质谱仪
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Application No.: US14371043Application Date: 2012-12-21
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Publication No.: US09177775B2Publication Date: 2015-11-03
- Inventor: Hideki Hasegawa , Hiroyuki Satake , Masao Suga , Yuichiro Hashimoto
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-010604 20120123
- International Application: PCT/JP2012/083193 WO 20121221
- International Announcement: WO2013/111485 WO 20130801
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/24 ; H01J49/06 ; H01J49/26

Abstract:
An object of the present invention is to prevent lowering of introduction efficiency of ions and to reduce labor for a cleaning operation. In order to solve the above problems, the present invention provides a mass spectrometer where ion introduction hole of an electrode is divided into a first region, a second region, and a third region, a central axis direction of the ion introduction hole in both or either one of the first region and the third region is different from a flow direction axis of the ion inside the ion introduction hole in the second region, and axes of the ion introduction hole in the first region and the third region are in an eccentric position relationship.
Public/Granted literature
- US20150001392A1 MASS ANALYSIS DEVICE Public/Granted day:2015-01-01
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