Invention Grant
- Patent Title: Automatic probe ground connection checking techniques
- Patent Title (中): 自动探头接地连接检查技术
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Application No.: US13649303Application Date: 2012-10-11
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Publication No.: US09194888B2Publication Date: 2015-11-24
- Inventor: Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: TEKTRONIX, INC.
- Current Assignee: TEKTRONIX, INC.
- Current Assignee Address: US OR Beaverton
- Agent Marger Johnson; William K. Bucher
- Main IPC: G01R31/04
- IPC: G01R31/04 ; G01R1/067 ; G06F19/00 ; G01R31/02

Abstract:
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Public/Granted literature
- US20140103951A1 AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES Public/Granted day:2014-04-17
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