Invention Grant
- Patent Title: High stability spintronic memory
- Patent Title (中): 高度稳定的自旋电记忆
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Application No.: US13996603Application Date: 2013-03-28
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Publication No.: US09231194B2Publication Date: 2016-01-05
- Inventor: Charles C. Kuo , Kaan Oguz , Brian S. Doyle , Elijah V. Karpov , Roksana Golizadeh Mojarad , David L. Kencke , Robert S. Chau
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- International Application: PCT/US2013/034506 WO 20130328
- International Announcement: WO2014/158178 WO 20141002
- Main IPC: H01L43/10
- IPC: H01L43/10 ; G11C11/16 ; H01L43/12 ; H01L43/08 ; H01F10/32

Abstract:
An embodiment includes a magnetic tunnel junction (MTJ) including a free magnetic layer, a fixed magnetic layer, and a tunnel barrier between the free and fixed layers; the tunnel barrier directly contacting a first side of the free layer; and an oxide layer directly contacting a second side of the free layer; wherein the tunnel barrier includes an oxide and has a first resistance-area (RA) product and the oxide layer has a second RA product that is lower than the first RA product. The MTJ may be included in a perpendicular spin torque transfer memory. The tunnel barrier and oxide layer form a memory having high stability with an RA product not substantively higher than a less stable memory having a MTJ with only a single oxide layer. Other embodiments are described herein.
Public/Granted literature
- US20140291663A1 HIGH STABILITY SPINTRONIC MEMORY Public/Granted day:2014-10-02
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