Invention Grant
- Patent Title: Adhesive pattern for advance package reliability improvement
- Patent Title (中): 粘合剂图案提前包装可靠性提高
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Application No.: US14093856Application Date: 2013-12-02
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Publication No.: US09287233B2Publication Date: 2016-03-15
- Inventor: Chin-Liang Chen , Wei-Ting Lin , Kuan-Lin Ho , Yu-Chih Liu , Chun-Cheng Lin , Shih-Yen Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Associates, LLC
- Main IPC: H01L23/12
- IPC: H01L23/12 ; H01L23/34 ; H01L23/10 ; H01L23/00 ; H01L23/42 ; H01L23/367

Abstract:
The present disclosure relates to an integrated chip package having a plurality of different adhesive layers that provide for a low lid induced stress good warpage control of a substrate and/or IC die, and an associated method of formation. The integrated chip package has an integrated chip (IC) die coupled to an underlying substrate by an electrically conductive interconnect structure. A first adhesive layer, having a first Young's modulus, is disposed onto the substrate at a first plurality of positions surrounding the IC die. A second adhesive layer, having a second Young's modulus different than the first Young's modulus, is disposed onto the substrate at a second plurality of positions surrounding the IC die. A lid is affixed to the substrate by the first and second adhesive layers and extends to a position overlying the IC die.
Public/Granted literature
- US20150155221A1 ADHESIVE PATTERN FOR ADVANCE PACKAGE RELIABILITY IMPROVEMENT Public/Granted day:2015-06-04
Information query
IPC分类: