Invention Grant
- Patent Title: Method of manufacturing a semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US14794561Application Date: 2015-07-08
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Publication No.: US09287251B2Publication Date: 2016-03-15
- Inventor: Pil-Kyu Kang , Seok-Ho Kim , Tae-Yeong Kim , Hyo-Ju Kim , Byung-Lyul Park , Yeun-Sang Park , Jin-Ho An , Ho-Jin Lee , Joo-Hee Jang , Deok-Young Jung
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley, P.A.
- Priority: KR10-2014-0090916 20140718
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L25/00 ; H01L21/768 ; H01L23/00

Abstract:
In a method, a first opening is formed in a first insulating interlayer on a first substrate. A first conductive pattern structure contacting a first diffusion prevention insulation pattern and having a planarized top surface is formed in the first opening. Likewise, a second conductive pattern structure contacting a second diffusion prevention insulation pattern is formed in a second insulating interlayer on a second substrate. A plasma treatment process is performed on at least one of the first and second substrates having the first and second conductive pattern structures thereon, respectively. The first and second conductive pattern structures are contacted to each other to bond the first and second substrates.
Public/Granted literature
- US20160020197A1 Method of Manufacturing a Semiconductor Device Public/Granted day:2016-01-21
Information query
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