发明授权
- 专利标题: Capacitor array and layout design method thereof
- 专利标题(中): 电容阵列及其布局设计方法
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申请号: US14396737申请日: 2013-11-28
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公开(公告)号: US09336347B2公开(公告)日: 2016-05-10
- 发明人: Yan Wang , Yu-Xin Wang , Gang-Yi Hu , Ting Li , Tao Liu , Guang-Bing Chen
- 申请人: China Electronic Technology Corporation, 24th Research Institute
- 申请人地址: CN Chongqing
- 专利权人: CHINA ELECTRONIC TECHNOLOGY CORPORATION, 24TH RESEARCH INSTITUTE
- 当前专利权人: CHINA ELECTRONIC TECHNOLOGY CORPORATION, 24TH RESEARCH INSTITUTE
- 当前专利权人地址: CN Chongqing
- 代理商 Cheng-Ju Chiang
- 优先权: CN201310502617 20131023
- 国际申请: PCT/CN2013/087992 WO 20131128
- 国际公布: WO2015/058437 WO 20150430
- 主分类号: H01G4/38
- IPC分类号: H01G4/38 ; G06F17/50 ; H01G15/00 ; H03M1/16 ; H03M1/44
摘要:
A layout design method is provided for generating capacitor arrays being described in four steps: first, the wiring mode of unit capacitors is defined allowing the wire being connected to the upper plate to parallel that to the lower one, second, a capacitor array layout is designed with capacitors being distributed in Mh lines, Mh is the maximum of capacitors' lines, the line numbers of Class 1 to Class K capacitors are defined in the unilateral capacitor array, third, the wiring mode is set for capacitor array making sure the lengths of the wires to the upper and lower plates of unit capacitors are equal, at last, parasitic parameters are characterized in ways that verify the layout. A capacitor array is provided as well. By eliminating capacitance mismatching caused by parasitic capacitance, the method works to generate a well-matched capacitor array in an easy and efficient way.
公开/授权文献
- US20150370952A1 CAPACITOR ARRAY AND LAYOUT DESIGN METHOD THEREOF 公开/授权日:2015-12-24
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