- Patent Title: Method for fabricating a cavity structure, for fabricating a cavity structure for a semiconductor structure and a semiconductor microphone fabricated by the same
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Application No.: US14044654Application Date: 2013-10-02
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Publication No.: US09363609B2Publication Date: 2016-06-07
- Inventor: Wolfgang Friza , Thomas Grille , Klaus Muemmler , Guenter Ziegler , Carsten Ahrens
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H04R23/00 ; B81C1/00 ; G01L9/00 ; H04R19/00 ; H04R31/00

Abstract:
Embodiments show a method for fabricating a cavity structure, a semiconductor structure, a cavity structure for a semiconductor device and a semiconductor microphone fabricated by the same. In some embodiments the method for fabricating a cavity structure comprises providing a first layer, depositing a carbon layer on the first layer, covering at least partially the carbon layer with a second layer to define the cavity structure, removing by means of dry etching the carbon layer between the first and second layer so that the cavity structure is formed.
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