Invention Grant
- Patent Title: X-ray sources using linear accumulation
- Patent Title (中): X射线源使用线性积分
-
Application No.: US14490672Application Date: 2014-09-19
-
Publication No.: US09390881B2Publication Date: 2016-07-12
- Inventor: Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agent Franklin Schellenberg
- Main IPC: G21K1/06
- IPC: G21K1/06 ; H01J35/08

Abstract:
A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness.Some embodiments of the invention comprise x-ray optical elements placed between sub-sources of x-rays. These x-ray optical elements may form images of one or more x-ray sub-sources in alignment with other x-ray sub-sources, and may enhance the linear accumulation that can be achieved.
Public/Granted literature
- US20150110252A1 X-RAY SOURCES USING LINEAR ACCUMULATION Public/Granted day:2015-04-23
Information query