Invention Grant
- Patent Title: Chemical-mechanical planarization of polymer films
- Patent Title (中): 聚合物膜的化学机械平面化
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Application No.: US14035037Application Date: 2013-09-24
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Publication No.: US09434859B2Publication Date: 2016-09-06
- Inventor: Sudeep Pallikkara Kuttiatoor , Renhe Jia , Jeffrey Dysard
- Applicant: Cabot Microelectronics Corporation
- Applicant Address: US IL Aurora
- Assignee: Cabot Microelectronics Corporation
- Current Assignee: Cabot Microelectronics Corporation
- Current Assignee Address: US IL Aurora
- Agent Thomas Omholt; Arlene Homilla; Ashlee B. Szelag
- Main IPC: C09G1/02
- IPC: C09G1/02 ; B24B1/00

Abstract:
The invention provides a chemical-mechanical polishing composition and a method of chemically-mechanically polishing a substrate with the chemical-mechanical polishing composition. The polishing composition comprises (a) abrasive particles that comprise ceria, zirconia, silica, alumina, or a combination thereof, (b) a metal ion that is a Lewis Acid, (c) a ligand that is an aromatic carboxylic acid, an aromatic sulfonic acid, an aromatic acid amide, an amino acid, or a hydroxy-substituted N-heterocycle, and (d) an aqueous carrier, wherein the pH of the chemical-mechanical polishing composition is in the range of about 1 to about 4.
Public/Granted literature
- US20150083689A1 CHEMICAL-MECHANICAL PLANARIZATION OF POLYMER FILMS Public/Granted day:2015-03-26
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