Invention Grant
- Patent Title: Automated analyzer
- Patent Title (中): 自动分析仪
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Application No.: US14352192Application Date: 2012-10-12
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Publication No.: US09442128B2Publication Date: 2016-09-13
- Inventor: Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-228426 20111018
- International Application: PCT/JP2012/076377 WO 20121012
- International Announcement: WO2013/058170 WO 20130425
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/04 ; G01N35/00 ; G01N35/02

Abstract:
An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
Public/Granted literature
- US20140286824A1 AUTOMATED ANALYZER Public/Granted day:2014-09-25
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