Invention Grant
- Patent Title: Method of making an extreme ultraviolet pellicle
- Patent Title (中): 制造极紫外线防护薄膜的方法
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Application No.: US14980469Application Date: 2015-12-28
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Publication No.: US09442368B2Publication Date: 2016-09-13
- Inventor: Chih-Tsung Shih , Tien-Hsi Lee , Chia-Jen Chen , Shang-Chieh Chien , Shinn-Sheng Yu , Jeng-Horng Chen , Anthony Yen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Eschweiler & Associates, LLC
- Main IPC: G03F1/64
- IPC: G03F1/64 ; B29C71/02 ; G03F7/20

Abstract:
The present disclosure relates to a method of forming an extreme ultraviolet (EUV) pellicle having an pellicle film connected to a pellicle frame without a supportive mesh, and an associated apparatus. In some embodiments, the method is performed by forming a cleaving plane within a substrate. A pellicle frame is attached to an upper surface of the substrate, and the substrate is cleaved along the cleaving plane to form a pellicle film attached to the pellicle frame. The method forms the pellicle without using a support structure, which may block EUV radiation and cause substantial non-uniformities in the intensity of EUV radiation incident on an EUV reticle.
Public/Granted literature
- US20160109798A1 METHOD OF MAKING AN EXTREME ULTRAVIOLET PELLICLE Public/Granted day:2016-04-21
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