Invention Grant
US09444037B2 Magnetoresistive memory element having a metal oxide tunnel barrier
有权
具有金属氧化物隧道势垒的磁阻存储元件
- Patent Title: Magnetoresistive memory element having a metal oxide tunnel barrier
- Patent Title (中): 具有金属氧化物隧道势垒的磁阻存储元件
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Application No.: US15043633Application Date: 2016-02-15
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Publication No.: US09444037B2Publication Date: 2016-09-13
- Inventor: Renu Whig , Jason Janesky , Nicholas Rizzo , Jon Slaughter , Dimitri Houssameddine
- Applicant: Everspin Technologies, Inc.
- Applicant Address: US AZ Chandler
- Assignee: Everspin Technologies, Inc.
- Current Assignee: Everspin Technologies, Inc.
- Current Assignee Address: US AZ Chandler
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L43/02 ; H01L27/22 ; H01L43/08 ; H01L43/10

Abstract:
A magnetoresistive memory array including a plurality of magnetoresistive memory elements wherein each magnetoresistive memory element comprises a free layer including at least one ferromagnetic layer having perpendicular magnetic anisotropy, a fixed layer, and a tunnel barrier, disposed between and in contact with the free and fixed layers. The tunnel barrier includes a first metal-oxide layer, having a thickness between 1 and 10 Angstroms, a second metal-oxide layer, having a thickness between 3 and 6 Angstroms, disposed on the first metal-oxide layer, and a third metal-oxide layer, having a thickness between 3 and 6 Angstroms, disposed over the second metal-oxide layer. In one embodiment, the third metal-oxide layer is in contact with the free layer or fixed layer. The tunnel barrier may also include a fourth metal-oxide layer, having a thickness between 1 and 10 Angstroms, disposed between the second and third metal-oxide layers.
Public/Granted literature
- US20160172582A1 Magnetoresistive Memory Element having a Metal Oxide Tunnel Barrier Public/Granted day:2016-06-16
Information query
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