Invention Grant
- Patent Title: Integrated photodetector waveguide structure with alignment tolerance
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Application No.: US14963520Application Date: 2015-12-09
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Publication No.: US09466740B2Publication Date: 2016-10-11
- Inventor: Solomon Assefa , Bruce W. Porth , Steven M. Shank
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent Steven Meyers; Andrew M. Calderon
- Main IPC: H01L31/18
- IPC: H01L31/18 ; G02B6/42 ; H01L31/0232 ; H01L31/028 ; G02B6/122 ; G02B6/136 ; H01L31/0203 ; H01L31/09
Abstract:
An encapsulated integrated photodetector waveguide structures with alignment tolerance and methods of manufacture are disclosed. The method includes forming a waveguide structure bounded by one or more shallow trench isolation (STI) structure(s). The method further includes forming a photodetector fully landed on the waveguide structure.
Public/Granted literature
- US20160085039A1 INTEGRATED PHOTODETECTOR WAVEGUIDE STRUCTURE WITH ALIGNMENT TOLERANCE Public/Granted day:2016-03-24
Information query
IPC分类:
