Invention Grant
- Patent Title: Automatic analyzer and method for detecting measurement value abnormalities
- Patent Title (中): 自动分析仪和检测测量值异常的方法
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Application No.: US14367066Application Date: 2012-11-22
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Publication No.: US09506942B2Publication Date: 2016-11-29
- Inventor: Akihisa Makino , Masahiko Iijima , Akiko Watanabe
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-284467 20111226
- International Application: PCT/JP2012/080377 WO 20121122
- International Announcement: WO2013/099486 WO 20130704
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/00 ; G01N21/53

Abstract:
An automatic analyzer detects measurement value abnormalities stemming from reaction process anomalies caused by the presence of foreign matter or bubbles. It is determined whether the results of concentration calculation based on light quantity data from multiple target detectors each fall within an applicable determination range. If the results fall within the determination range, an average value of the results of concentration calculation with the target detectors is calculated, and if not, an out-of-determination-range flag is given. A default fluctuation range is retrieved regarding the average value of the results of concentration calculation. The fluctuation range of the results of concentration calculation with the multiple target detectors is calculated. If the fluctuation range is found to fall within the default range, the results of concentration calculation are output to a display; and if outside the default range, a reexamination request is displayed with an added measurement value abnormality alarm.
Public/Granted literature
- US20140356964A1 AUTOMATIC ANALYZER AND METHOD FOR DETECTING MEASUREMENT VALUE ABNORMALITIES Public/Granted day:2014-12-04
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