An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; and an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input or output signal of the DUT.