Invention Grant
US09574989B2 Lens-free imaging system and method for detecting particles in sample deposited on image sensor
有权
用于检测沉积在图像传感器上的样品中的颗粒的无镜头成像系统和方法
- Patent Title: Lens-free imaging system and method for detecting particles in sample deposited on image sensor
- Patent Title (中): 用于检测沉积在图像传感器上的样品中的颗粒的无镜头成像系统和方法
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Application No.: US14455182Application Date: 2014-08-08
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Publication No.: US09574989B2Publication Date: 2017-02-21
- Inventor: Junzhao Lei
- Applicant: OmniVision Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lathrop & Gage LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N15/14 ; G01N21/64 ; G01N15/00 ; G01N15/10

Abstract:
A lens-free imaging system for detecting particles in a sample deposited on image sensor includes a fluidic chamber for holding a sample and an image sensor for imaging the sample, wherein the image sensor has a light receiving surface and a plurality of photosensitive pixels disposed underneath the light receiving surface, and wherein the fluidic chamber formed at least in part by the light receiving surface. A method for detecting particles of interest in a sample deposited on an image sensor, through lens-free imaging using the image sensor, includes (ii) generating an image of the sample, deposited on a light receiving surface of the image sensor, by illuminating the sample, and (ii) detecting the particles of interest in the image.
Public/Granted literature
- US20160041094A1 LENS-FREE IMAGING SYSTEM AND METHOD FOR DETECTING PARTICLES IN SAMPLE DEPOSITED ON IMAGE SENSOR Public/Granted day:2016-02-11
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